1. VLSI design and test for systems dependability /
پدیدآورنده : Shojiro Asai, editor.
کتابخانه: مرکز و کتابخانه مطالعات اسلامی به زبانهای اروپایی (قم)
موضوع : Integrated circuits-- Very large scale integration-- Design and construction.,Integrated circuits-- Very large scale integration-- Testing.,Integrated circuits-- Very large scale integration-- Design and construction.,Integrated circuits-- Very large scale integration-- Testing.,TECHNOLOGY & ENGINEERING-- Mechanical.
رده :
TK7874
